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Method of measuring scattering of x-rays, its applications and implementation device

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https://hal-normandie-univ.archives-ouvertes.fr/hal-01949471
Contributor : Aurélien Lemercier <>
Submitted on : Monday, December 10, 2018 - 10:40:58 AM
Last modification on : Monday, December 2, 2019 - 2:44:05 PM

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  • HAL Id : hal-01949471, version 1

Citation

Gérard Coquerel, Morgane Sanselme, Anaïs Lafontaine. Method of measuring scattering of x-rays, its applications and implementation device. France, Patent n° : EP2694953A1. 2012. ⟨hal-01949471⟩

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