Method of measuring scattering of x-rays, its applications and implementation device

Gérard Coquerel; Morgane Sanselme; Anaïs Lafontaine

Patents Year : 2012

Method of measuring scattering of x-rays, its applications and implementation device

(1) , (1) , (1)

1

Gérard Coquerel

Function : Author
PersonId : 170836
IdHAL : gerard-coquerel
ORCID : 0000-0001-8977-8676
IdRef : 069151113

Sciences et Méthodes Séparatives

Morgane Sanselme

Function : Author
PersonId : 178503
IdHAL : morgane-sanselme

Sciences et Méthodes Séparatives

Anaïs Lafontaine

Function : Author

Sciences et Méthodes Séparatives

Domains

Chemical Sciences Material chemistry Chemical Sciences Cristallography Chemical Sciences Organic chemistry

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https://hal-normandie-univ.archives-ouvertes.fr/hal-01949471

Submitted on : Monday, December 10, 2018-10:40:58 AM

Last modification on : Wednesday, March 9, 2022-3:56:03 PM

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hal-01949471 , version 1 (10-12-2018)

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HAL Id : hal-01949471 , version 1

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Gérard Coquerel, Morgane Sanselme, Anaïs Lafontaine. Method of measuring scattering of x-rays, its applications and implementation device. France, Patent n° : EP2694953A1. 2012. ⟨hal-01949471⟩

Method of measuring scattering of x-rays, its applications and implementation device

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