Method of measuring scattering of x-rays, its applications and implementation device

Gérard Coquerel; Morgane Sanselme; Anaïs Lafontaine

Patents

Method of measuring scattering of x-rays, its applications and implementation device

Gérard Coquerel ¹ Morgane Sanselme ¹ Anaïs Lafontaine ¹

1 SMS - Sciences et Méthodes Séparatives

Document type :

Patents

Domain :

Chemical Sciences / Material chemistry

Chemical Sciences / Cristallography

Chemical Sciences / Organic chemistry

Complete list of metadata

https://hal-normandie-univ.archives-ouvertes.fr/hal-01949471
Contributor : Aurélien Lemercier <>
Submitted on : Monday, December 10, 2018 - 10:40:58 AM
Last modification on : Monday, December 2, 2019 - 2:44:05 PM

Method of measuring scattering of x-rays, its applications and implementation device

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Method of measuring scattering of x-rays, its applications and implementation device

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