Patents
Year : 2012
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https://hal-normandie-univ.archives-ouvertes.fr/hal-01949471
Submitted on : Monday, December 10, 2018-10:40:58 AM
Last modification on : Wednesday, March 9, 2022-3:56:03 PM
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- HAL Id : hal-01949471 , version 1
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Gérard Coquerel, Morgane Sanselme, Anaïs Lafontaine. Method of measuring scattering of x-rays, its applications and implementation device. France, Patent n° : EP2694953A1. 2012. ⟨hal-01949471⟩
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