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F. Zhu, F. Fouquet, B. Ravelo, M. Kadi, and A. Alaeddine, Experimental investigation of Zener diode reliability under pulsed Electrical Overstress (EOS), Microelectronics Reliability, vol.53, issue.9, pp.1288-1292, 2013.
URL : https://hal.archives-ouvertes.fr/hal-02306929

F. Zhu, B. Ravelo, F. Fouquet, and M. Kadi, Electrical predictive model of Zener diode under pulsed EOS, Electronic Letters, vol.51, issue.4, pp.327-328, 2015.
URL : https://hal.archives-ouvertes.fr/hal-02407347

, Confé rences internationales

F. Zhu, F. Fouquet, B. Ravelo, and M. Kadi, Reliability of CMOS IC under square wave pulsed EOS, Proc. of 17ème Colloque international sur la compatibilité électromagnétique (CEM 2014, pp.1-6, 2014.

F. Zhu, B. Ravelo, F. Fouquet, and M. Kadi, Test of Zener Diode under Bi-Exponential Pulsed EOS, 8th Annual International Electrostatic Discharge Workshop, pp.19-22, 2014.

F. Zhu, F. Fouquet, B. Ravelo, M. Kadi, and A. Alaeddine, Experimental investigation of Zener diode reliability under pulsed Electrical Overstress (EOS), Proc. of 24th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2013, p.30
URL : https://hal.archives-ouvertes.fr/hal-02306929