Stress-induced metallic behavior under magnetic field in Pr1−xCaxMnO3 (x=0.5 and 0.4) thin films (invited)

Wilfrid Prellier (1) , Ch. Simon (1) , B. Mercey (1) , M. Hervieu (1) , A. Haghiri-Gosnet (2) , D. Saurel (1) , Ph. Lecoeur (1) , B. Raveau (1)

1 CRISMAT - Laboratoire de cristallographie et sciences des matériaux
2 L2M - Laboratoire de Microstructures et de Microélectronique

Domains: Physics [physics]; Chemical Sciences; Chemical Sciences; Material chemistry

Wilfrid Prellier, Ch. Simon, B. Mercey, M. Hervieu, A. Haghiri-Gosnet, et al.. Stress-induced metallic behavior under magnetic field in Pr1−xCaxMnO3 (x=0.5 and 0.4) thin films (invited). Journal of Applied Physics, 2001, 89 (11), pp.6612-6617. ⟨10.1063/1.1357134⟩. ⟨hal-03544299⟩