Reliability and failure analysis in power GaN-HEMTs during S-band pulsed-RF operating

Niemat Moultif (1) , Sébastien Duguay (1) , O. Latry (1) , M. Ndiaye (2) , Eric Joubert (1)

1 GPM - Groupe de physique des matériaux
2 CEVAA - Centre d’Essai en Vibro-Acoustique pour l’Automobile

Domaines: Micro et nanotechnologies/Microélectronique; Matériaux; Electronique

Niemat Moultif, Sébastien Duguay, O. Latry, M. Ndiaye, Eric Joubert. Reliability and failure analysis in power GaN-HEMTs during S-band pulsed-RF operating. Microelectronics Reliability, 2021, 126, pp.114295. ⟨10.1016/j.microrel.2021.114295⟩. ⟨hal-03469148⟩