Reliability and failure analysis in power GaN-HEMTs during S-band pulsed-RF operating - Archive ouverte HAL Access content directly
Journal Articles Microelectronics Reliability Year : 2021

Reliability and failure analysis in power GaN-HEMTs during S-band pulsed-RF operating

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Niemat Moultif
Sébastien Duguay
O. Latry
Eric Joubert

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hal-03469148 , version 1 (07-12-2021)

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Niemat Moultif, Sébastien Duguay, O. Latry, M. Ndiaye, Eric Joubert. Reliability and failure analysis in power GaN-HEMTs during S-band pulsed-RF operating. Microelectronics Reliability, 2021, 126, pp.114295. ⟨10.1016/j.microrel.2021.114295⟩. ⟨hal-03469148⟩
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