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Reliability and failure analysis in power GaN-HEMTs during S-band pulsed-RF operating

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https://hal-normandie-univ.archives-ouvertes.fr/hal-03469148
Contributor : Niemat Moultif Connect in order to contact the contributor
Submitted on : Tuesday, December 7, 2021 - 3:07:19 PM
Last modification on : Tuesday, January 4, 2022 - 5:46:28 AM

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Niemat Moultif, Sébastien Duguay, O. Latry, M. Ndiaye, Joubert Eric. Reliability and failure analysis in power GaN-HEMTs during S-band pulsed-RF operating. Microelectronics Reliability, Elsevier, 2021, 126, pp.114295. ⟨10.1016/j.microrel.2021.114295⟩. ⟨hal-03469148⟩

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