In Situ X-ray diffraction for a better understanding of industrial crystallization processes : the In-SituX technology

Simon Clevers (1) , Morgane Sanselme (1) , Yohann Cartigny (1) , Gérard Coquerel (1)

1 SMS - Sciences et Méthodes Séparatives

Domains: Cristallography; Material chemistry; Inorganic chemistry; Chemical and Process Engineering; Materials

Simon Clevers, Morgane Sanselme, Yohann Cartigny, Gérard Coquerel. In Situ X-ray diffraction for a better understanding of industrial crystallization processes : the In-SituX technology. Journées de la division Chimie du Solide - SCF, Nov 2017, Montpellier, France. ⟨hal-02432644⟩