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Estimation of MOSFET Degradation Inside a DC DC Converter Using Joint Kalman Filtering

Ahmad Alyakhni Ahmad Al-Mohamad Ghaleb Hoblos 1
1 Pôle Automatique et Systèmes
IRSEEM - Institut de Recherche en Systèmes Electroniques Embarqués
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Conference papers
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https://hal-normandie-univ.archives-ouvertes.fr/hal-02331247
Contributor : Ghaleb Hoblos <>
Submitted on : Thursday, October 24, 2019 - 12:26:35 PM
Last modification on : Thursday, September 10, 2020 - 5:46:16 PM

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  • HAL Id : hal-02331247, version 1

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Ahmad Alyakhni, Ahmad Al-Mohamad, Ghaleb Hoblos. Estimation of MOSFET Degradation Inside a DC DC Converter Using Joint Kalman Filtering. 4th International Conference on Control and Fault-Tolerant Systems, Sep 2019, Casablanca, Morocco. ⟨hal-02331247⟩

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