https://hal-normandie-univ.archives-ouvertes.fr/hal-02310344 Contributor : Moncef KADIConnect in order to contact the contributor Submitted on : Thursday, October 10, 2019 - 9:54:07 AM Last modification on : Thursday, March 10, 2022 - 10:46:02 AM
Jian Zhi Fu, Francois Fouquet, Moncef Kadi, Pascal Dherbécourt. Behavoir study of a 600v gan transistor under short-circuit experimental test. TELECOM 2017 et 10ème JFMMA, May 2017, Rabat, Morocco. ⟨hal-02310344⟩