Conference Papers
Year :
Moncef KADI : Connect in order to contact the contributor
https://hal-normandie-univ.archives-ouvertes.fr/hal-02310344
Submitted on : Thursday, October 10, 2019-9:54:07 AM
Last modification on : Friday, March 24, 2023-2:53:12 PM
Dates and versions
Identifiers
- HAL Id : hal-02310344 , version 1
Cite
Jian Zhi Fu, Francois Fouquet, Moncef Kadi, Pascal Dherbécourt. Behavoir study of a 600v gan transistor under short-circuit experimental test. TELECOM 2017 et 10ème JFMMA, May 2017, Rabat, Morocco. ⟨hal-02310344⟩
Collections
16
View
0
Download