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Degradation of Au–Ti contacts of SiGe HBTs during electromagnetic field stress

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https://hal-normandie-univ.archives-ouvertes.fr/hal-02308187
Contributor : Moncef Kadi <>
Submitted on : Tuesday, October 8, 2019 - 1:08:37 PM
Last modification on : Wednesday, October 9, 2019 - 1:34:42 AM

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A Alaeddine, C. Genevois, Moncef Kadi, F. Cuvilly, K. Daoud. Degradation of Au–Ti contacts of SiGe HBTs during electromagnetic field stress. Semiconductor Science and Technology, IOP Publishing, 2011, 26 (2), pp.025003. ⟨10.1088/0268-1242/26/2/025003⟩. ⟨hal-02308187⟩

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