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Modelling of integrated circuit susceptibility to conducted electromagnetic disturbances using neural networks theory

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https://hal-normandie-univ.archives-ouvertes.fr/hal-02307005
Contributor : Moncef KADI Connect in order to contact the contributor
Submitted on : Monday, October 7, 2019 - 11:22:17 AM
Last modification on : Thursday, March 10, 2022 - 10:46:02 AM

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I. Chahine, Moncef Kadi, E. Gaboriaud, C. Maziere, A. Louis, et al.. Modelling of integrated circuit susceptibility to conducted electromagnetic disturbances using neural networks theory. Electronics Letters, IET, 2006, 42 (18), pp.1022. ⟨10.1049/el:20061903⟩. ⟨hal-02307005⟩

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