Skip to Main content Skip to Navigation
Journal articles

Modelling of integrated circuit susceptibility to conducted electromagnetic disturbances using neural networks theory

Document type :
Journal articles
Complete list of metadatas

https://hal-normandie-univ.archives-ouvertes.fr/hal-02307005
Contributor : Moncef Kadi <>
Submitted on : Monday, October 7, 2019 - 11:22:17 AM
Last modification on : Wednesday, October 9, 2019 - 1:37:29 AM

Identifiers

Citation

I. Chahine, Moncef Kadi, E. Gaboriaud, C. Maziere, A. Louis, et al.. Modelling of integrated circuit susceptibility to conducted electromagnetic disturbances using neural networks theory. Electronics Letters, IET, 2006, 42 (18), pp.1022. ⟨10.1049/el:20061903⟩. ⟨hal-02307005⟩

Share

Metrics

Record views

16