Modelling of integrated circuit susceptibility to conducted electromagnetic disturbances using neural networks theory

I. Chahine; Moncef Kadi; E. Gaboriaud; C. Maziere; A. Louis; B. Mazari

doi:10.1049/el:20061903

Journal Articles Electronics Letters Year : 2006

Modelling of integrated circuit susceptibility to conducted electromagnetic disturbances using neural networks theory

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1

I. Chahine

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Moncef Kadi

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Institut de Recherche en Systèmes Electroniques Embarqués

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E. Gaboriaud

Function : Author

C. Maziere

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A. Louis

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B. Mazari

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Institut de Recherche en Systèmes Electroniques Embarqués

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Physics [physics] Engineering Sciences [physics]

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Submitted on : Monday, October 7, 2019-11:22:17 AM

Last modification on : Thursday, March 10, 2022-10:46:02 AM

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hal-02307005 , version 1 (07-10-2019)

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HAL Id : hal-02307005 , version 1
DOI : 10.1049/el:20061903

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I. Chahine, Moncef Kadi, E. Gaboriaud, C. Maziere, A. Louis, et al.. Modelling of integrated circuit susceptibility to conducted electromagnetic disturbances using neural networks theory. Electronics Letters, 2006, 42 (18), pp.1022. ⟨10.1049/el:20061903⟩. ⟨hal-02307005⟩

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Modelling of integrated circuit susceptibility to conducted electromagnetic disturbances using neural networks theory

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