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Journal Articles IET Science Measurement and Technology Year : 2007

Enhancement of accuracy for measuring the susceptibility of integrated circuits to conducted electromagnetic disturbances

I. Chahine
  • Function : Author
Institut de Recherche en Systèmes Electroniques Embarqués
Moncef Kadi
Institut de Recherche en Systèmes Electroniques Embarqués
CV
E. Gaboriaud
  • Function : Author
X. Gallenne
  • Function : Author
A. Louis
  • Function : Author
B. Mazari
  • Function : Author
Institut de Recherche en Systèmes Electroniques Embarqués

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Physics [physics] Engineering Sciences [physics]

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https://hal-normandie-univ.archives-ouvertes.fr/hal-02306991

Submitted on : Monday, October 7, 2019-11:19:00 AM

Last modification on : Thursday, March 10, 2022-10:46:02 AM

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hal-02306991 , version 1 (07-10-2019)

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I. Chahine, Moncef Kadi, E. Gaboriaud, X. Gallenne, A. Louis, et al.. Enhancement of accuracy for measuring the susceptibility of integrated circuits to conducted electromagnetic disturbances. IET Science Measurement and Technology, 2007, 1 (5), pp.240-244. ⟨10.1049/iet-smt:20060142⟩. ⟨hal-02306991⟩

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