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Enhancement of accuracy for measuring the susceptibility of integrated circuits to conducted electromagnetic disturbances

I. Chahine 1 Moncef Kadi 1 E. Gaboriaud X. Gallenne A. Louis B. Mazari 1
1 IRSEEM - Institut de Recherche en Systèmes Electroniques Embarqués
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https://hal-normandie-univ.archives-ouvertes.fr/hal-02306991
Contributor : Moncef Kadi <>
Submitted on : Monday, October 7, 2019 - 11:19:00 AM
Last modification on : Wednesday, October 9, 2019 - 1:37:29 AM

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COMUE-NORMANDIE | ESIGELEC | UNIROUEN | IRSEEM

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I. Chahine, Moncef Kadi, E. Gaboriaud, X. Gallenne, A. Louis, et al.. Enhancement of accuracy for measuring the susceptibility of integrated circuits to conducted electromagnetic disturbances. IET Science Measurement and Technology, Institution of Engineering and Technology, 2007, 1 (5), pp.240-244. ⟨10.1049/iet-smt:20060142⟩. ⟨hal-02306991⟩

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