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Journal Articles IET Science Measurement and Technology Year : 2007

Enhancement of accuracy for measuring the susceptibility of integrated circuits to conducted electromagnetic disturbances

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hal-02306991 , version 1 (07-10-2019)

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I. Chahine, Moncef Kadi, E. Gaboriaud, X. Gallenne, A. Louis, et al.. Enhancement of accuracy for measuring the susceptibility of integrated circuits to conducted electromagnetic disturbances. IET Science Measurement and Technology, 2007, 1 (5), pp.240-244. ⟨10.1049/iet-smt:20060142⟩. ⟨hal-02306991⟩
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