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Journal articles
Enhancement of accuracy for measuring the susceptibility of integrated circuits to conducted electromagnetic disturbances
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IRSEEM - Institut de Recherche en Systèmes Electroniques Embarqués (Technopôle du Madrillet - Avenue Galilée BP 10024 76801 Saint-Étienne-du-Rouvray Cedex - France)
- UNIROUEN - Université de Rouen Normandie : EA 4353 (1, rue Thomas Becket 76821 Mont-Saint-Aignan Cedex - France)
- NU - Normandie Université (Esplanade de la Paix - CS 14032 - 14032 Caen Cedex 5 - France)
- ESIGELEC - École Supérieure d’Ingénieurs en Génie Électrique (Technopôle du Madrillet - Avenue Galilée - BP 10024 - 76801 Saint-Étienne-du-Rouvray Cedex - France)
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Journal articles
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https://hal-normandie-univ.archives-ouvertes.fr/hal-02306991
Contributor : Moncef Kadi <>
Submitted on : Monday, October 7, 2019 - 11:19:00 AM
Last modification on : Wednesday, October 9, 2019 - 1:37:29 AM
Contributor : Moncef Kadi <>
Submitted on : Monday, October 7, 2019 - 11:19:00 AM
Last modification on : Wednesday, October 9, 2019 - 1:37:29 AM
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- HAL Id : hal-02306991, version 1
- DOI : 10.1049/iet-smt:20060142
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Citation
I. Chahine, Moncef Kadi, E. Gaboriaud, X. Gallenne, A. Louis, et al.. Enhancement of accuracy for measuring the susceptibility of integrated circuits to conducted electromagnetic disturbances. IET Science Measurement and Technology, Institution of Engineering and Technology, 2007, 1 (5), pp.240-244. ⟨10.1049/iet-smt:20060142⟩. ⟨hal-02306991⟩
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