Journal Articles
International Journal of Microwave and Wireless Technologies
Year : 2009
Moncef KADI : Connect in order to contact the contributor
https://hal-normandie-univ.archives-ouvertes.fr/hal-02306952
Submitted on : Monday, October 7, 2019-11:02:11 AM
Last modification on : Friday, March 24, 2023-2:53:12 PM
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Ali Alaeddine, Moncef Kadi, Kaouther Daoud, Hichame Maanane, Philippe Eudeline. Study of electromagnetic field stress impact on SiGe heterojunction bipolar transistor performance. International Journal of Microwave and Wireless Technologies, 2009, 1 (6), pp.475-482. ⟨10.1017/S1759078709990572⟩. ⟨hal-02306952⟩
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