Journal Articles
Microelectronics Reliability
Year : 2013
Moncef KADI : Connect in order to contact the contributor
https://hal-normandie-univ.archives-ouvertes.fr/hal-02306929
Submitted on : Monday, October 7, 2019-10:48:32 AM
Last modification on : Thursday, March 10, 2022-10:46:02 AM
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- HAL Id : hal-02306929 , version 1
- DOI : 10.1016/j.microrel.2013.07.077
Cite
F. Zhu, F. Fouquet, B. Ravelo, A. Alaeddine, Moncef Kadi. Experimental investigation of Zener diode reliability under pulsed Electrical Overstress (EOS). Microelectronics Reliability, 2013, 53 (9-11), pp.1288-1292. ⟨10.1016/j.microrel.2013.07.077⟩. ⟨hal-02306929⟩
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