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Experimental investigation of Zener diode reliability under pulsed Electrical Overstress (EOS)

F. Zhu 1 F. Fouquet 2, 1 B. Ravelo 1 A. Alaeddine 1 Moncef Kadi 1 
1 IRSEEM - Institut de Recherche en Systèmes Electroniques Embarqués
2 ESIGELEC - École Supérieure d’Ingénieurs en Génie Électrique
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https://hal-normandie-univ.archives-ouvertes.fr/hal-02306929
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Submitted on : Monday, October 7, 2019 - 10:48:32 AM
Last modification on : Thursday, March 10, 2022 - 10:46:02 AM

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COMUE-NORMANDIE | IRSEEM | UNIROUEN | ESIGELEC

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F. Zhu, F. Fouquet, B. Ravelo, A. Alaeddine, Moncef Kadi. Experimental investigation of Zener diode reliability under pulsed Electrical Overstress (EOS). Microelectronics Reliability, Elsevier, 2013, 53 (9-11), pp.1288-1292. ⟨10.1016/j.microrel.2013.07.077⟩. ⟨hal-02306929⟩

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