https://hal-normandie-univ.archives-ouvertes.fr/hal-02306903
Contributor : Moncef Kadi <>
Submitted on : Monday, October 7, 2019 - 10:36:38 AM Last modification on : Tuesday, May 26, 2020 - 3:15:56 PM
Samh Khemiri, Moncef Kadi. Reliability of Radio Frequency Power Transistors to Electromagnetic and Thermal Stress. Embedded Mechatronic Systems 1, Elsevier, pp.141-164, 2015, ⟨10.1016/B978-1-78548-013-3.50006-1⟩. ⟨hal-02306903⟩