https://hal-normandie-univ.archives-ouvertes.fr/hal-02306903 Contributor : Moncef KadiConnect in order to contact the contributor Submitted on : Monday, October 7, 2019 - 10:36:38 AM Last modification on : Thursday, March 10, 2022 - 10:46:02 AM
Samh Khemiri, Moncef Kadi. Reliability of Radio Frequency Power Transistors to Electromagnetic and Thermal Stress. Embedded Mechatronic Systems 1, Elsevier, pp.141-164, 2015, ⟨10.1016/B978-1-78548-013-3.50006-1⟩. ⟨hal-02306903⟩