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Year : 2015
Moncef KADI : Connect in order to contact the contributor
https://hal-normandie-univ.archives-ouvertes.fr/hal-02306903
Submitted on : Monday, October 7, 2019-10:36:38 AM
Last modification on : Thursday, March 10, 2022-10:46:02 AM
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- HAL Id : hal-02306903 , version 1
- DOI : 10.1016/B978-1-78548-013-3.50006-1
Cite
Samh Khemiri, Moncef Kadi. Reliability of Radio Frequency Power Transistors to Electromagnetic and Thermal Stress. Embedded Mechatronic Systems 1, Elsevier, pp.141-164, 2015, ⟨10.1016/B978-1-78548-013-3.50006-1⟩. ⟨hal-02306903⟩
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