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Reliability of Radio Frequency Power Transistors to Electromagnetic and Thermal Stress

Samh Khemiri 1 Moncef Kadi 2
1 IRSEEM - Institut de Recherche en Systèmes Electroniques Embarqués
2 Pôle Electronique et Systèmes
IRSEEM - Institut de Recherche en Systèmes Electroniques Embarqués
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https://hal-normandie-univ.archives-ouvertes.fr/hal-02306903
Contributor : Moncef Kadi Connect in order to contact the contributor
Submitted on : Monday, October 7, 2019 - 10:36:38 AM
Last modification on : Tuesday, October 19, 2021 - 4:18:11 PM

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COMUE-NORMANDIE | ESIGELEC | UNIROUEN | IRSEEM

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Samh Khemiri, Moncef Kadi. Reliability of Radio Frequency Power Transistors to Electromagnetic and Thermal Stress. Embedded Mechatronic Systems 1, Elsevier, pp.141-164, 2015, ⟨10.1016/B978-1-78548-013-3.50006-1⟩. ⟨hal-02306903⟩

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