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Reliability of Radio Frequency Power Transistors to Electromagnetic and Thermal Stress

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hal-02306903 , version 1 (07-10-2019)

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Samh Khemiri, Moncef Kadi. Reliability of Radio Frequency Power Transistors to Electromagnetic and Thermal Stress. Embedded Mechatronic Systems 1, Elsevier, pp.141-164, 2015, ⟨10.1016/B978-1-78548-013-3.50006-1⟩. ⟨hal-02306903⟩
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