Method of Characterizing the Electromagnetic Environment in Hyperfrequency Circuits Encapsulated within Metallic Cavities

Samh Khemiri; Abhishek Ramanujan; Moncef Kadi; Zouheir Riah

doi:10.1016/B978-1-78548-013-3.50003-6

Book Sections Year : 2015

Method of Characterizing the Electromagnetic Environment in Hyperfrequency Circuits Encapsulated within Metallic Cavities

(1) , (2) , (3) , (3)

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Samh Khemiri

Function : Author

Institut de Recherche en Systèmes Electroniques Embarqués

Abhishek Ramanujan

Function : Author

VALEO

Moncef Kadi

Function : Author
PersonId : 173747
IdHAL : moncef-kadi
IdRef : 084533242

Pôle Electronique et Systèmes

CV

Zouheir Riah

Function : Author
PersonId : 177853
IdHAL : zouheir-riah
IdRef : 088663213

Pôle Electronique et Systèmes

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Physics [physics] Engineering Sciences [physics]

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https://hal-normandie-univ.archives-ouvertes.fr/hal-02306900

Submitted on : Monday, October 7, 2019-10:34:27 AM

Last modification on : Thursday, March 10, 2022-10:46:02 AM

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hal-02306900 , version 1 (07-10-2019)

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HAL Id : hal-02306900 , version 1
DOI : 10.1016/B978-1-78548-013-3.50003-6

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Samh Khemiri, Abhishek Ramanujan, Moncef Kadi, Zouheir Riah. Method of Characterizing the Electromagnetic Environment in Hyperfrequency Circuits Encapsulated within Metallic Cavities. Embedded Mechatronic Systems 1, Elsevier, pp.57-77, 2015, ⟨10.1016/B978-1-78548-013-3.50003-6⟩. ⟨hal-02306900⟩

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Method of Characterizing the Electromagnetic Environment in Hyperfrequency Circuits Encapsulated within Metallic Cavities

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