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High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations

Fahim Hami Habib Boulzazen 1 Moncef Kadi 1 
1 Pôle Electronique et Systèmes
IRSEEM - Institut de Recherche en Systèmes Electroniques Embarqués
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Conference papers
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https://hal-normandie-univ.archives-ouvertes.fr/hal-02306892
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Submitted on : Monday, October 7, 2019 - 10:28:40 AM
Last modification on : Thursday, March 10, 2022 - 10:46:02 AM

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Fahim Hami, Habib Boulzazen, Moncef Kadi. High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations. 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), May 2015, Pisa, Italy. pp.334-339, ⟨10.1109/I2MTC.2015.7151290⟩. ⟨hal-02306892⟩

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