High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations

Fahim Hami; Habib Boulzazen; Moncef Kadi

doi:10.1109/I2MTC.2015.7151290

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High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations

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Fahim Hami

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Habib Boulzazen

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PersonId : 177722
IdHAL : habib-boulzazen
ORCID : 0000-0002-5829-2865
IdRef : 157748480

Pôle Electronique et Systèmes

Moncef Kadi

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PersonId : 173747
IdHAL : moncef-kadi
IdRef : 084533242

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Physics [physics] Engineering Sciences [physics]

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Submitted on : Monday, October 7, 2019-10:28:40 AM

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hal-02306892 , version 1 (07-10-2019)

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HAL Id : hal-02306892 , version 1
DOI : 10.1109/I2MTC.2015.7151290

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Fahim Hami, Habib Boulzazen, Moncef Kadi. High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations. 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), May 2015, Pisa, Italy. pp.334-339, ⟨10.1109/I2MTC.2015.7151290⟩. ⟨hal-02306892⟩

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High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations

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