High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations - Archive ouverte HAL Access content directly
Conference Papers Year :

High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations

Fahim Hami
  • Function : Author
Habib Boulzazen
Moncef Kadi
Not file

Dates and versions

hal-02306892 , version 1 (07-10-2019)

Identifiers

Cite

Fahim Hami, Habib Boulzazen, Moncef Kadi. High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations. 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), May 2015, Pisa, Italy. pp.334-339, ⟨10.1109/I2MTC.2015.7151290⟩. ⟨hal-02306892⟩
11 View
0 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More