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Simulation of conducted EMI in SiC MOSFET buck converters before and after aging

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https://hal-normandie-univ.archives-ouvertes.fr/hal-02306875
Contributor : Moncef Kadi <>
Submitted on : Monday, October 7, 2019 - 10:19:39 AM
Last modification on : Tuesday, September 8, 2020 - 1:52:27 PM

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Shawki Douzi, Mohamed Tlig, Jaleleddine Ben Hadj Slama, Moncef Kadi. Simulation of conducted EMI in SiC MOSFET buck converters before and after aging. 2016 7th International Conference on Sciences of Electronics, Technologies of Information and Telecommunications (SETIT), Dec 2016, Hammamet, Tunisia. pp.171-176, ⟨10.1109/SETIT.2016.7939861⟩. ⟨hal-02306875⟩

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