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Aging of GaN GIT under repetitive short-circuit tests

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https://hal-normandie-univ.archives-ouvertes.fr/hal-02306848
Contributor : Moncef Kadi <>
Submitted on : Monday, October 7, 2019 - 10:10:02 AM
Last modification on : Tuesday, September 8, 2020 - 1:44:56 PM

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J-Z. Fu, F. Fouquet, Moncef Kadi, Pascal Dherbécourt. Aging of GaN GIT under repetitive short-circuit tests. 2018 1st Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia), May 2018, Xi'an, China. pp.189-193, ⟨10.1109/WiPDAAsia.2018.8734539⟩. ⟨hal-02306848⟩

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