https://hal-normandie-univ.archives-ouvertes.fr/hal-02305454
Contributor : Moncef Kadi <>
Submitted on : Friday, October 4, 2019 - 11:07:36 AM Last modification on : Tuesday, May 26, 2020 - 4:35:20 PM
Shawki Douzi, Moncef Kadi, Habib Boulzazen, Mohamed Tlig, Jaleleddine Ben Hadj Slama. Radiated EMI evolution of power SiC MOSFET in a boost converter after short-circuit aging tests. Microelectronics Reliability, Elsevier, 2019, pp.113398. ⟨10.1016/j.microrel.2019.113398⟩. ⟨hal-02305454⟩