In situ X-ray for monitoring crystallization and phase transitions in suspension: In-situX®

Chemical Sciences Analytical chemistry Chemical Sciences Cristallography Chemical Sciences Material chemistry Chemical Sciences Theoretical and/or physical chemistry Physics [physics] Physics [physics] Chemical Physics [physics.chem-ph] Physics [physics] Physics [physics] Optics [physics.optics]

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Poster In-situX Clevers_VF.pdf (3.29 Mo)

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https://hal-normandie-univ.archives-ouvertes.fr/hal-02295903

Submitted on : Tuesday, September 24, 2019-3:34:00 PM

Last modification on : Thursday, December 15, 2022-1:53:54 PM

Long-term archiving on: Sunday, February 9, 2020-9:47:58 PM

Dates and versions

hal-02295903 , version 1 (24-09-2019)

Identifiers

HAL Id : hal-02295903 , version 1

Cite

Simon Clevers, A. Lafontaine, G. Baaklini, M. Schindler, Morgane Sanselme, et al.. In situ X-ray for monitoring crystallization and phase transitions in suspension: In-situX®. BIWIC 2019 International Workshop on Industrial Crystallization, Aug 2019, Rayong, Thailand. . ⟨hal-02295903⟩