Conference Papers
Year : 2019
Etienne Talbot : Connect in order to contact the contributor
https://hal-normandie-univ.archives-ouvertes.fr/hal-02294165
Submitted on : Monday, September 23, 2019-11:20:10 AM
Last modification on : Friday, March 24, 2023-2:53:12 PM
Cite
Rémi DEMOULIN, M. Roussel, S. Duguay, D. Muller, D. Mathiot, et al.. Characterization of p-type Doping in Silicon Nanocrystals Embedded in SiO 2. Microscopy & Microanalysis 2019, Aug 2019, Portland, United States. pp.2540-2541, ⟨10.1017/S1431927619013436⟩. ⟨hal-02294165⟩
Collections
21
View
0
Download