Study of the impact of dielectric aging on coplanar waveguide performance

Abstract : In this paper, we study the impact of electrical and thermal stress on line loss and characteristic impedance of a CoPlanar Waveguides (CPWs). The de-rating of the line propagation constants and impedance characteristic are analyzed and discussed with respect to the stress level applied to the dielectric. The physical mechanisms leading to dielectric properties variation is explained. © 2015 IEEE.
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https://hal-normandie-univ.archives-ouvertes.fr/hal-02184739
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Soumis le : mardi 16 juillet 2019 - 11:31:27
Dernière modification le : mercredi 14 août 2019 - 17:16:01

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A.P. Nguyen, U. Lüders, F. Voiron. Study of the impact of dielectric aging on coplanar waveguide performance. 2015 IEEE International Integrated Reliability Workshop (IIRW), 2016, South Lake Tahoe, United States. pp.103-106, ⟨10.1109/IIRW.2015.7437078⟩. ⟨hal-02184739⟩

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