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Study of the impact of dielectric aging on coplanar waveguide performance

A.P. Nguyen 1 U. Lüders 1 F. Voiron 2
1 CRISMAT - Laboratoire de cristallographie et sciences des matériaux
2 IPDiA
Abstract : In this paper, we study the impact of electrical and thermal stress on line loss and characteristic impedance of a CoPlanar Waveguides (CPWs). The de-rating of the line propagation constants and impedance characteristic are analyzed and discussed with respect to the stress level applied to the dielectric. The physical mechanisms leading to dielectric properties variation is explained. © 2015 IEEE.
Keywords : characteristic impedance charges Coplanar waveguide (CPW) dielectric stress line loss mobile ions
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Conference papers
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https://hal-normandie-univ.archives-ouvertes.fr/hal-02184739
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Submitted on : Tuesday, July 16, 2019 - 11:31:27 AM
Last modification on : Wednesday, August 14, 2019 - 5:16:01 PM

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A.P. Nguyen, U. Lüders, F. Voiron. Study of the impact of dielectric aging on coplanar waveguide performance. 2015 IEEE International Integrated Reliability Workshop (IIRW), 2016, South Lake Tahoe, United States. pp.103-106, ⟨10.1109/IIRW.2015.7437078⟩. ⟨hal-02184739⟩

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