Skip to Main content Skip to Navigation
Conference papers

Study of the impact of dielectric aging on coplanar waveguide performance

A.P. Nguyen 1 U. Lüders 1 F. Voiron 2 
1 CRISMAT - Laboratoire de cristallographie et sciences des matériaux
2 IPDiA
Abstract : In this paper, we study the impact of electrical and thermal stress on line loss and characteristic impedance of a CoPlanar Waveguides (CPWs). The de-rating of the line propagation constants and impedance characteristic are analyzed and discussed with respect to the stress level applied to the dielectric. The physical mechanisms leading to dielectric properties variation is explained. © 2015 IEEE.
Keywords : Characteristic impedance Line loss Mobile ions Stress Coplanar waveguides Dielectrics Silicon Impedance Substrates Temperature measurement Ageing Dielectrics materials Thermal stresses Dielectric stress Coplanar waveguide (CPW) Charges
Document type :
Conference papers
Complete list of metadata
https://hal-normandie-univ.archives-ouvertes.fr/hal-02184739
Contributor : Université Normandie Connect in order to contact the contributor
Submitted on : Tuesday, July 16, 2019 - 11:31:27 AM
Last modification on : Saturday, June 25, 2022 - 9:53:44 AM

Identifiers

Collections

CNRS | COMUE-NORMANDIE | INC-CNRS | ENSICAEN | UNICAEN | CRISMAT

Citation

A.P. Nguyen, U. Lüders, F. Voiron. Study of the impact of dielectric aging on coplanar waveguide performance. 2015 IEEE International Integrated Reliability Workshop (IIRW), Oct 2015, South Lake Tahoe, United States. pp.103-106, ⟨10.1109/IIRW.2015.7437078⟩. ⟨hal-02184739⟩

Export

BibTeX TEI DC DCterms EndNote Datacite

Share

Metrics

Record views

11