Niemat Moultif, Eric Joubert, Olivier Latry. SiC MOSFET robustness to ESD study: Correlation between electrical and spectral photo-emission characterizations.
2018 19th IEEE Mediterranean Electrotechnical Conference (MELECON), May 2018, Marrakech, France. pp.260-264,
⟨10.1109/MELCON.2018.8379104⟩.
⟨hal-02181679⟩