Reliability Study of Mechatronic Power Components Using Spectral Photon Emission Microscopy - Normandie Université Accéder directement au contenu
Article Dans Une Revue Advanced Electromagnetics Année : 2016

Reliability Study of Mechatronic Power Components Using Spectral Photon Emission Microscopy

Niemat Moultif
Eric Joubert
O. Latry

Résumé

In this paper, we present one of the most important failure analysis tools that permits the localizing and the identification of the failure mechanisms. It is a new spectral photon emission system, enabling to localize the failure, and quickly get the photon emission spectra that characterize the failure with high resolution. A diffraction grating is used as a spectrometer in the system. Application results on mechatronic power devices such as HEMT AlGaN/GAN and SiC MOSFETs are reported.

Dates et versions

hal-02177964 , version 1 (09-07-2019)

Identifiants

Citer

Niemat Moultif, Eric Joubert, O. Latry. Reliability Study of Mechatronic Power Components Using Spectral Photon Emission Microscopy. Advanced Electromagnetics, 2016, 5 (3), pp.20. ⟨10.7716/aem.v5i3.380⟩. ⟨hal-02177964⟩
199 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More