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Journal articles
Reliability Study of Mechatronic Power Components Using Spectral Photon Emission Microscopy
Abstract : In this paper, we present one of the most important failure analysis tools that permits the localizing and the identification of the failure mechanisms. It is a new spectral photon emission system, enabling to localize the failure, and quickly get the photon emission spectra that characterize the failure with high resolution. A diffraction grating is used as a spectrometer in the system. Application results on mechatronic power devices such as HEMT AlGaN/GAN and SiC MOSFETs are reported.
https://hal-normandie-univ.archives-ouvertes.fr/hal-02177964
Contributor : Eric Joubert Connect in order to contact the contributor
Submitted on : Tuesday, July 9, 2019 - 2:27:19 PM
Last modification on : Tuesday, October 19, 2021 - 4:14:38 PM
Contributor : Eric Joubert Connect in order to contact the contributor
Submitted on : Tuesday, July 9, 2019 - 2:27:19 PM
Last modification on : Tuesday, October 19, 2021 - 4:14:38 PM
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