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Reliability Study of Mechatronic Power Components Using Spectral Photon Emission Microscopy

Abstract : In this paper, we present one of the most important failure analysis tools that permits the localizing and the identification of the failure mechanisms. It is a new spectral photon emission system, enabling to localize the failure, and quickly get the photon emission spectra that characterize the failure with high resolution. A diffraction grating is used as a spectrometer in the system. Application results on mechatronic power devices such as HEMT AlGaN/GAN and SiC MOSFETs are reported.
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https://hal-normandie-univ.archives-ouvertes.fr/hal-02177964
Contributor : Eric Joubert <>
Submitted on : Tuesday, July 9, 2019 - 2:27:19 PM
Last modification on : Tuesday, May 12, 2020 - 8:52:06 AM

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N. Moultif, E. Joubert, O. Latry. Reliability Study of Mechatronic Power Components Using Spectral Photon Emission Microscopy. Advanced Electromagnetics, Advanced Electromagnetics, 2016, 5 (3), pp.20. ⟨10.7716/aem.v5i3.380⟩. ⟨hal-02177964⟩

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