Transmission electron microscopy on metal-organic frameworks - a review

Christian Wiktor (1) , Maria Meledina (2) , Stuart Turner (3) , Oleg I. Lebedev (4) , Roland A. Fischer (5)

1 FAU - Friedrich-Alexander Universität Erlangen-Nürnberg
2 RWTH - Rheinisch-Westfälische Technische Hochschule Aachen University
3 UA - University of Antwerp
4 CRISMAT - Laboratoire de cristallographie et sciences des matériaux
5 TUM - Technische Universität Munchen - Université Technique de Munich [Munich, Allemagne]

Versatile materials like metal-organic frameworks require careful characterization. Transmission electron microscopy is a very powerful method that can address a multitude of investigative challenges. In this review we present TEM studies that yielded valuable insights into the investigated MOFs to illustrate the potential of TEM despite the sensitivity of MOFs to the electron beam.

Domains: Chemical Sciences; Cristallography; Material chemistry; Theoretical and/or physical chemistry

Christian Wiktor, Maria Meledina, Stuart Turner, Oleg I. Lebedev, Roland A. Fischer. Transmission electron microscopy on metal-organic frameworks - a review. Journal of Materials Chemistry A, 2017, 5 (29), pp.14969-14989. ⟨10.1039/c7ta00194k⟩. ⟨hal-02175373⟩