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Development of a new X-ray diffractometer in a reflexion mode -θ/-θ for in situ characterization during crystallization processes

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https://hal-normandie-univ.archives-ouvertes.fr/hal-01941076
Contributor : Aurélien Lemercier <>
Submitted on : Friday, November 30, 2018 - 4:43:02 PM
Last modification on : Monday, December 2, 2019 - 2:44:05 PM

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  • HAL Id : hal-01941076, version 1

Citation

A. Lafontaine, Y. Cartigny, M. Sanselme, G. Coquerel. Development of a new X-ray diffractometer in a reflexion mode -θ/-θ for in situ characterization during crystallization processes. ISIC-19 (International Symposium on Industrial Crystallization), Sep 2014, Toulouse, France. ⟨hal-01941076⟩

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