Development of a new X-ray diffractometer in a reflexion mode -θ/-θ for in situ characterization during crystallization processes - Archive ouverte HAL Access content directly
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Development of a new X-ray diffractometer in a reflexion mode -θ/-θ for in situ characterization during crystallization processes

A. Lafontaine
  • Function : Author
Sciences et Méthodes Séparatives
Y. Cartigny
Sciences et Méthodes Séparatives
M. Sanselme
Sciences et Méthodes Séparatives
G. Coquerel
Sciences et Méthodes Séparatives

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Chemical Sciences Chemical Sciences Material chemistry Chemical Sciences Cristallography Chemical Sciences Organic chemistry

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https://hal-normandie-univ.archives-ouvertes.fr/hal-01941076

Submitted on : Friday, November 30, 2018-4:43:02 PM

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hal-01941076 , version 1 (30-11-2018)

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  • HAL Id : hal-01941076 , version 1

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A. Lafontaine, Y. Cartigny, M. Sanselme, G. Coquerel. Development of a new X-ray diffractometer in a reflexion mode -θ/-θ for in situ characterization during crystallization processes. ISIC-19 (International Symposium on Industrial Crystallization), Sep 2014, Toulouse, France. ⟨hal-01941076⟩

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