In situ monitoring of Fast Crystallization by means of X-Ray Diffraction - Archive ouverte HAL Access content directly
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In situ monitoring of Fast Crystallization by means of X-Ray Diffraction

S. Clevers
Sciences et Méthodes Séparatives
CV
V. Nachbaur
M. Sanselme
Sciences et Méthodes Séparatives
V. Dupray
Sciences et Méthodes Séparatives
CV
P. Cardinael
Sciences et Méthodes Séparatives
G. Coquerel
Sciences et Méthodes Séparatives
J.M. Lebreton

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Chemical Sciences Chemical Sciences Material chemistry Chemical Sciences Cristallography Chemical Sciences Organic chemistry

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https://hal-normandie-univ.archives-ouvertes.fr/hal-01940878

Submitted on : Friday, November 30, 2018-3:38:40 PM

Last modification on : Wednesday, March 9, 2022-3:56:04 PM

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hal-01940878 , version 1 (30-11-2018)

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  • HAL Id : hal-01940878 , version 1

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S. Clevers, V. Nachbaur, M. Sanselme, V. Dupray, P. Cardinael, et al.. In situ monitoring of Fast Crystallization by means of X-Ray Diffraction. XXXX èmes JEEP (Joint European days on Equilibrium between Phases), Mar 2014, Lyon, France. ⟨hal-01940878⟩

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