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Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs

D. Boudier 1 B Cretu 1 E. Simoen 2 G. Hellings 2 T. Schram 2 H. Mertens 2 D. Linten 2 
1 Equipe Electronique - Laboratoire GREYC - UMR6072
GREYC - Groupe de Recherche en Informatique, Image et Instrumentation de Caen
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D. Boudier, B Cretu, E. Simoen, G. Hellings, T. Schram, et al.. Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs. Solid-State Electronics, Elsevier, 2019, pp.107732. ⟨10.1016/j.sse.2019.107732⟩. ⟨hal-02438740⟩

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